Preparation and characterization of (CuAlSe2)1-x (TaSe)x alloy system (0 ≤ X ≤ 0.5)

Resumen

Polycrystalline samples of (CuAlSe2)1-x (TaSe)x alloy system were prepared by the usual melt and anneal technique in the composition range 0 < x ≤ 0.5. The obtained ingots (1 gr) were characterized by x-ray powder diffraction and differential thermal analysis techniques. Güinier photographs shows the presence of two phases in the entire composition range studied; for 0 ≤ x ≤ 0.3 the main phase indexes as tetragonal with unit cell parameters very close to the ternary CuAlSe2 whereas the secondary phase appears as a trace. For 0.3 < x ≤ 0.5 the two phase are present in approximately the same proportion.